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Applications of Low and Ultra-low Energy Scanning Electron Microscopy

Authors :
Ilona Müllerová
Eliška Mikmeková
Luděk Frank
Šárka Mikmeková
Source :
Microscopy and Microanalysis. 25:472-473
Publication Year :
2019
Publisher :
Oxford University Press (OUP), 2019.

Subjects

Subjects :
Materials science
Low energy
Scanning electron microscope
business.industry
Optoelectronics
business
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
25
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........e851a3fb6c6b8a942cd97b7c18c73bc6
Full Text :
https://doi.org/10.1017/s143192761900309x
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