The Difference Between Secondary Electron Imaging In Variable Pressure SEM And Conventional SEM: Can They Ever Be The Same?

Authors :: John R. Michael
Brendan Griffin
David C. Joy
Source :: Microscopy and Microanalysis. 19:368-369
Publication Year :: 2013
Publisher :: Oxford University Press (OUP), 2013.
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Subjects :: Materials science
Variable pressure
Composite material
Instrumentation
Secondary electrons

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