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Some optical and electron microscope comparative studies of excimer laser‐assisted and nonassisted molecular‐beam epitaxically grown thin GaAs films on Si

Authors :
Wade C. Tang
J. K. Liu
Frank J. Grunthaner
Anupam Madhukar
S. Guha
K. C. Rajkumar
Pudong Lao
Source :
Journal of Applied Physics. 67:6445-6453
Publication Year :
1990
Publisher :
AIP Publishing, 1990.

Abstract

We present results of Raman and Rayleigh scattering, near‐band‐edge photoluminescence, and electron microscope examination of GaAs thin films (

Details

ISSN :
10897550 and 00218979
Volume :
67
Database :
OpenAIRE
Journal :
Journal of Applied Physics
Accession number :
edsair.doi...........e6a4fb38b51096a7caef57793ca7f5bc
Full Text :
https://doi.org/10.1063/1.345118