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Some optical and electron microscope comparative studies of excimer laser‐assisted and nonassisted molecular‐beam epitaxically grown thin GaAs films on Si
- Source :
- Journal of Applied Physics. 67:6445-6453
- Publication Year :
- 1990
- Publisher :
- AIP Publishing, 1990.
-
Abstract
- We present results of Raman and Rayleigh scattering, near‐band‐edge photoluminescence, and electron microscope examination of GaAs thin films (
Details
- ISSN :
- 10897550 and 00218979
- Volume :
- 67
- Database :
- OpenAIRE
- Journal :
- Journal of Applied Physics
- Accession number :
- edsair.doi...........e6a4fb38b51096a7caef57793ca7f5bc
- Full Text :
- https://doi.org/10.1063/1.345118