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Hot Electron Emission Lithography: a method for efficient large area e-beam projection

Authors :
R. M. Tromp
M. Poppeller
Eduard A. Cartier
Source :
Microelectronic Engineering. 46:183-186
Publication Year :
1999
Publisher :
Elsevier BV, 1999.

Abstract

We have developed an electron lithography method, Hot Electron Emission Lithography (HEEL), which is capable of printing integrated circuits with an exposure time of only a few seconds. The basic design of the mask, manufactured by standard MOS technology, will be discussed. Patterns printed into e-beam resist by a 1:1 projection system show the applicability of the mask for lithography purposes. The minimum feature size projected so far is 160 nm in a system capable of 90 nm resolution. Further improvements in resolution to 50 nm are possible

Details

ISSN :
01679317
Volume :
46
Database :
OpenAIRE
Journal :
Microelectronic Engineering
Accession number :
edsair.doi...........e662f326fd6378624d9f930b866685da
Full Text :
https://doi.org/10.1016/s0167-9317(99)00058-1