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Imaging of Defect Rich Heterogeneous Interfaces using Compressive Sensing STEM

Authors :
Daniel Nicholls
Jack Wells
Mounib Bahri
Nigel D Browning
Source :
Microscopy and Microanalysis. 28:2488-2489
Publication Year :
2022
Publisher :
Oxford University Press (OUP), 2022.

Subjects

Subjects :
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
28
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........e5de2223b776b0e71ed1300a6f1cf40e
Full Text :
https://doi.org/10.1017/s1431927622009515
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