Reliability Improvement and Effective Switching Layer Model of Thin‐Film MoS 2 Memristors

Authors :: Yifu Huang
Yuqian Gu
Sivasakthya Mohan
Andrei Dolocan
Nicholas D. Ignacio
Shanmukh Kutagulla
Kevin Matthews
Alejandra Londoño‐Calderon
Yao‐Feng Chang
Ying‐Chen Chen
Jamie H. Warner
Michael T. Pettes
Jack C. Lee
Deji Akinwande
Source :: Advanced Functional Materials.
Publication Year :: 2023
Publisher :: Wiley, 2023.

Subjects :: Biomaterials
Electrochemistry
Condensed Matter Physics
Electronic, Optical and Magnetic Materials

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