Pattern-Free Growth of Carbon Nanotube Tips for Scanning Probe Microscopy

Authors :: Kathryn A. Moler
Hanshen Zhang
Erhan Yenilmez
Li Zhang
Zhifeng Deng
Source :: Nanoscience and Nanotechnology Letters. 3:669-673
Publication Year :: 2011
Publisher :: American Scientific Publishers, 2011.

Subjects :: Scanning probe microscopy
Materials science
law
business.industry
Scanning ion-conductance microscopy
Optoelectronics
General Materials Science
Carbon nanotube
Scanning capacitance microscopy
business
law.invention

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