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A comprehensive variability study of doped HfO2 FeFET for memory applications

Authors :
N. Ronchi
L. -A. Ragnarsson
U. Celano
B. Kaczer
K. Kaczmarek
K. Banerjee
S. R. C. McMitchell
G. Van den bosch
J. Van Houdt
Source :
2022 IEEE International Memory Workshop (IMW).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE International Memory Workshop (IMW)
Accession number :
edsair.doi...........e4ef99654aa02ef998ce600d3ac412fb

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