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[Untitled]
- Source :
- Journal of Low Temperature Physics. 118:75-89
- Publication Year :
- 2000
- Publisher :
- Springer Science and Business Media LLC, 2000.
-
Abstract
- We have measured the temperature dependence of resistivity in relatively thick Nb/Al bilayers fabricated at room temperature, observing the decrease of ρ for increasing T typical of Anderson localization in disordered systems. We report the experimental conditions which determine this behavior and compare it to theoretical models for localization in 3D systems.
- Subjects :
- Superconductivity
Anderson localization
Materials science
Condensed matter physics
Transition temperature
Niobium
chemistry.chemical_element
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Electron localization function
chemistry
Electrical resistivity and conductivity
General Materials Science
Thin film
Anderson impurity model
Subjects
Details
- ISSN :
- 00222291
- Volume :
- 118
- Database :
- OpenAIRE
- Journal :
- Journal of Low Temperature Physics
- Accession number :
- edsair.doi...........e455a2b15dcbe9cac5a190ce29dff287
- Full Text :
- https://doi.org/10.1023/a:1004678503644