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X-ray fluorescence in the SEM - advantages in material analysis

Authors :
R. Eckert
Source :
Scanning. 8:232-238
Publication Year :
1986
Publisher :
Wiley, 1986.

Subjects

Subjects :
Materials science
Material analysis
Analytical chemistry
X-ray fluorescence
Instrumentation
Atomic and Molecular Physics, and Optics

Details

ISSN :
01610457
Volume :
8
Database :
OpenAIRE
Journal :
Scanning
Accession number :
edsair.doi...........e4468db61ef1f595c8cb5c77c33ef34c
Full Text :
https://doi.org/10.1002/sca.4950080506
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