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Electron microscopy of nanostructured semiconductor materials
- Source :
- Materials Chemistry and Physics. 81:364-367
- Publication Year :
- 2003
- Publisher :
- Elsevier BV, 2003.
-
Abstract
- For various material systems of low dimensions, including multilayers, islands, and quantum dots, the potential applicability of transmission electron microscopy (TEM) is demonstrated. Conventional TEM is applied to elucidate size, shape, and arrangement of nanostructures, whereas high-resolution imaging is used for visualizing their atomic structure. In addition, microchemical peculiarities of the nanoscopic objects are investigated by analytical TEM techniques (energy-filtered TEM, energy-dispersive X-ray spectroscopy).
- Subjects :
- Materials science
Nanostructure
Semiconductor materials
Physics::Optics
Nanotechnology
Condensed Matter Physics
law.invention
Condensed Matter::Materials Science
law
Transmission electron microscopy
Quantum dot
Physics::Atomic and Molecular Clusters
General Materials Science
Electron microscope
High-resolution transmission electron microscopy
Spectroscopy
Nanoscopic scale
Subjects
Details
- ISSN :
- 02540584
- Volume :
- 81
- Database :
- OpenAIRE
- Journal :
- Materials Chemistry and Physics
- Accession number :
- edsair.doi...........e2e81a5051aa24f6c5d305f5ee2211c6