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Accurate parametrization revealing an extremely low disorder in polymer field-effect transistors
- Source :
- Flexible and Printed Electronics. 7:025017
- Publication Year :
- 2022
- Publisher :
- IOP Publishing, 2022.
-
Abstract
- In this paper, a robust self-consistent parameter extraction method is applied to high-performance p-type printed polymer field-effect transistors. Simultaneous extraction of contact resistance and intrinsic channel mobility with their full gate-voltage dependence is achieved through an analytically reinforced transmission-line method. The proposed method yields a minimum width-normalized contact resistance of 12 kΩ cm and a maximum hole mobility of 1.9 cm2 V−1 s−1. Moreover, the gate-voltage-dependent mobility is interpreted in the framework of trap-and-release transport through double-exponential density of states, unveiling a disorder energy near the transport orbital as low as 29 meV.
- Subjects :
- Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Subjects
Details
- ISSN :
- 20588585
- Volume :
- 7
- Database :
- OpenAIRE
- Journal :
- Flexible and Printed Electronics
- Accession number :
- edsair.doi...........e200f1a20d15a612af5da2118a2386f5