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Progress Towards a Non-Lamination Encapsulation Technology to Improve Reliability and Reduce Costs

Authors :
Tushar M. Shimpi
Walajabad S. Sampath
James Morgante
Kurt L. Barth
Source :
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC).
Publication Year :
2019
Publisher :
IEEE, 2019.

Abstract

New solar module architectures and manufacturing technologies are being developed that significantly reduce manufacturing costs and improve reliability. Variants for both crystalline silicon and thin film devices are being optimized. The outcome of this ongoing program will be a new module designs, streamlined manufacturing processes and accelerated stress results showing improved reliability. Prototype encapsulation process will demonstrate cycle time under 1 minute compared to the current industry method of vacuum lamination which takes more than 10 minutes. The new technology will significantly lower manufacturing costs, process time and reduce capital expenditures by approximately 3-5 times

Details

Database :
OpenAIRE
Journal :
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
Accession number :
edsair.doi...........e191d4355b2948d43fa7ba936e3c710a
Full Text :
https://doi.org/10.1109/pvsc40753.2019.8981243