The Study of Inspection on Thin Film Resistance Strain Gauge Contact Failure by Electrical Excitation Thermal-Wave Imaging

Authors :: Xiaogang Sun
Fei Wang
Peng Song
Junyan Liu
Source :: IEEE Transactions on Industrial Electronics. 69:6288-6297
Publication Year :: 2022
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 2022.

Subjects :: Materials science
Control and Systems Engineering
Electrical and Electronic Engineering
Thin film
Composite material
Contact failure
Thermal wave
Strain gauge
Excitation

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