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Mobility calculation of Ge nanowire junctionless NFETs with size and geometry dependence

Authors :
Hung-Yu Ye
Huang-Siang Lan
Chia-Che Chung
Chee-Wee Liu
I-Hsieh Wong
Source :
2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).
Publication Year :
2018
Publisher :
IEEE, 2018.

Abstract

The channel cross section geometry and size dependence of the electron mobility in Ge nanowire nFETs is studied by theoretical calculations for devices beyond the 7nm node. circular channels have the highest mobility for wide channels (width>7nm) operating at high overdrive voltage (>0.5V). While diamond-shaped channels have the highest mobility for wide channels operating at low overdrive voltage (

Details

Database :
OpenAIRE
Journal :
2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
Accession number :
edsair.doi...........df13ca2c6181733961eebe73b0ff266b
Full Text :
https://doi.org/10.1109/vlsi-tsa.2018.8403824