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Double barrier resonant tunneling device with selectively applied field in the well

Authors :
Ashok Puri
A. M. Kan’an
Takashi Odagaki
Source :
Solid State Communications. 86:113-117
Publication Year :
1993
Publisher :
Elsevier BV, 1993.

Abstract

Resonant tunneling of an electron through a model Al0.5Ga0.5AsAlyGa1−yAsAl0.5Ga0.5As structure is investigated numerically using a transmission matrix approach. Our model considers the electric field, α in the well region only. This model is physically realized by changing Al-concentration continuously in the well region. Transmission coefficient is obtained as a function of incident electron energy for various α values. Tunneling characteristics (transmission coefficient vs voltage) are examined as a function of α. The effect of change in temperature is discussed.

Details

ISSN :
00381098
Volume :
86
Database :
OpenAIRE
Journal :
Solid State Communications
Accession number :
edsair.doi...........df0bb9077dbf3a81303a7483887c4e88