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Study of Co2MnxFe1-xSi Heusler Alloy by Cs-corrected STEM Imaging and Atomic resolution X-ray Spectrum Imaging

Authors :
Peng Zhang
C F Kisielowski
H Wang
B. Jiang
Z. Diao
D Delille
Source :
Microscopy and Microanalysis. 18:364-365
Publication Year :
2012
Publisher :
Oxford University Press (OUP), 2012.

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Details

ISSN :
14358115 and 14319276
Volume :
18
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........deea72a754716ddf30623b5af15c9461
Full Text :
https://doi.org/10.1017/s1431927612003674