Electron transport coefficients in SF6and xenon gas mixtures

The electron swarm growth processes in SF6-Xe gas mixtures have been studied by a pulsed Townsend method over the range 32.24≤E/N≤564.2 Td (1 Td = 10-21 Vm2), where E is the electric field and N is the gas density of the mixture. The variation patterns as a function of the density-reduced electric field of the effective ionization coefficient , electron drift velocity Ve and longitudinal diffusion coefficient DL in SF6-Xe gas mixtures have been given. The dielectric strength of SF6-Xe gas mixtures has also been determined, which varies linearly with SF6 concentration in the gas mixtures.