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Saturation Effect of Leakage Reactance

Authors :
Sheldon S. L. Chang
T. C. Lloyd
Source :
Transactions of the American Institute of Electrical Engineers. 68:1144-1147
Publication Year :
1949
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1949.

Details

ISSN :
00963860
Volume :
68
Database :
OpenAIRE
Journal :
Transactions of the American Institute of Electrical Engineers
Accession number :
edsair.doi...........de73eb1c688cd676ba72c3fa03c43c72
Full Text :
https://doi.org/10.1109/t-aiee.1949.5060065