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Fault Prediction Method Based on Improved Bidirectional Long Short-Term Memory Combined with Sample Entropy for Battery
- Source :
- 2023 IEEE 6th Information Technology,Networking,Electronic and Automation Control Conference (ITNEC).
- Publication Year :
- 2023
- Publisher :
- IEEE, 2023.
Details
- Database :
- OpenAIRE
- Journal :
- 2023 IEEE 6th Information Technology,Networking,Electronic and Automation Control Conference (ITNEC)
- Accession number :
- edsair.doi...........dd5f13eac11847984cd9ee7e3e5e5c66
- Full Text :
- https://doi.org/10.1109/itnec56291.2023.10081968