News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy

Authors :: Klaus Heizinger
Adrian Niculae
K. Hermenau
A. Bechteler
Lothar Strüder
Robert Lackner
Heike Soltau
Tristan Mönninghoff
Thiago Barros
Source :: Microscopy and Microanalysis. 25:516-517
Publication Year :: 2019
Publisher :: Oxford University Press (OUP), 2019.

Subjects :: Materials science
Silicon
chemistry
business.industry
Detector
High resolution
Optoelectronics
chemistry.chemical_element
Spectroscopy
business
Instrumentation

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