Scanning probe microscopy cantilevers improvement for advanced research and manipulation at nano scale

Scanning probe microscopy (SPM) is a widely used method for the different kind of objects investigation. It allows to obtain information about the surface topography including its mechanical and electromagnetic characteristics at nano scale. SPM also could be used for manipulation of nanoobjects. The most popular and widely used SPM methods are atomic force (AFM) and magnetic force microscopy (MFM). Both of them based on measuring interaction between sample and cantilever (probe). Type of cantilever its curvature radius, coating, resonant frequency, hardness and other parameters significantly influence on the SPM images. Scientist constantly improving process of probes producing to fit the current demands. It is important to keep in mind that collected AFM data could contain not only direct information about the sample but also it might be a convolution of the sample and cantilever in case then the tip size comparable with the studied object. Convolution effect limits the AFM resolution [1]. Thus one of the most important task for researchers is to minimize this effect by reducing tip size both for AFM and MFM methods.