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An Overview of the Development and Evaluation of a Benchtop microCT Scanner
- Source :
- AIP Conference Proceedings.
- Publication Year :
- 2010
- Publisher :
- AIP, 2010.
-
Abstract
- A microCT scanner prototype that uses a micro‐focus x‐ray source and flat panel detector has been developed in our laboratory. In this work the main system characteristics are described and some results of the initial performance evaluation are presented.
Details
- ISSN :
- 0094243X
- Database :
- OpenAIRE
- Journal :
- AIP Conference Proceedings
- Accession number :
- edsair.doi...........dbe6a3703e5d09089edb5d00e0ce7232
- Full Text :
- https://doi.org/10.1063/1.3531613