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Observation of Fatigue and Creep Ratcheting Failure in Solder Joints under Pulsed Direct Current Electromigration Testing
- Source :
- 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
- Publication Year :
- 2022
- Publisher :
- IEEE, 2022.
Details
- Database :
- OpenAIRE
- Journal :
- 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
- Accession number :
- edsair.doi...........dbe42f8e2e2d76b26bcde2530cdfb399
- Full Text :
- https://doi.org/10.1109/ectc51906.2022.00234