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Active Trap Determination at the Interface of Ge and InxGa1-xAs Substrates with Dielectric Layers
- Source :
- ECS Meeting Abstracts. :1899-1899
- Publication Year :
- 2011
- Publisher :
- The Electrochemical Society, 2011.
-
Abstract
- not Available.
Details
- ISSN :
- 21512043
- Database :
- OpenAIRE
- Journal :
- ECS Meeting Abstracts
- Accession number :
- edsair.doi...........db5d1044c48a5b8fd519986530f3ca2e
- Full Text :
- https://doi.org/10.1149/ma2011-02/27/1899