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Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS2 Revealed by Diffraction Contrast Tomography

Authors :
Kejian Qu
Hrishikesh Bale
Zachary W. Riedel
Junehu Park
Leilei Yin
André Schleife
Daniel P. Shoemaker
Source :
Crystal Growth & Design. 22:3228-3234
Publication Year :
2022
Publisher :
American Chemical Society (ACS), 2022.

Details

ISSN :
15287505 and 15287483
Volume :
22
Database :
OpenAIRE
Journal :
Crystal Growth & Design
Accession number :
edsair.doi...........db3add245d106ba09deddc4739d40818
Full Text :
https://doi.org/10.1021/acs.cgd.2c00078