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Mechanical Properties of a Langmuir−Blodgett Film Measured by Atomic Force Microscopy

Authors :
Kazuaki Suehiro
Miyuki Kuramori
Yushi Oishi
Tsutomu Umeda
Source :
Langmuir. 18:945-947
Publication Year :
2002
Publisher :
American Chemical Society (ACS), 2002.

Subjects

Subjects :
Kelvin probe force microscope
Materials science
Atomic force microscopy
Electrochemistry
General Materials Science
Nanotechnology
Surfaces and Interfaces
Conductive atomic force microscopy
Condensed Matter Physics
Langmuir–Blodgett film
Spectroscopy
Photoconductive atomic force microscopy

Details

ISSN :
15205827 and 07437463
Volume :
18
Database :
OpenAIRE
Journal :
Langmuir
Accession number :
edsair.doi...........db294614194386ad957b738a0f3c8b98
Full Text :
https://doi.org/10.1021/la010773g
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