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Investigation of Vertical Current Phenomena in the Insulator/Oxide Semiconductor Heterojunction Using XPS Analysis and an Atmospheric-Pressure Plasma Treatment System
- Source :
- ACS Applied Electronic Materials. 1:1698-1704
- Publication Year :
- 2019
- Publisher :
- American Chemical Society (ACS), 2019.
-
Abstract
- Transferring charge carriers through an insulator film between two metal electrodes is a major issue in various electronic devices, including metal/insulator/metal (MIM) diodes and resistive switch...
- Subjects :
- Resistive touchscreen
Materials science
business.industry
Heterojunction
Atmospheric-pressure plasma
Insulator (electricity)
Thin-film diode
Electronic, Optical and Magnetic Materials
X-ray photoelectron spectroscopy
Materials Chemistry
Electrochemistry
Optoelectronics
Charge carrier
business
Diode
Subjects
Details
- ISSN :
- 26376113
- Volume :
- 1
- Database :
- OpenAIRE
- Journal :
- ACS Applied Electronic Materials
- Accession number :
- edsair.doi...........dab3316de6aa82e200f22ab89dfd90e4
- Full Text :
- https://doi.org/10.1021/acsaelm.9b00384