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Resistive Memory Sensing Using Delta-Sigma Modulation

Authors :
R.J. Baker
H. Rapole
M. Balasubramanian
A. Rajagiri
Kristy A. Campbell
Source :
2009 IEEE Workshop on Microelectronics and Electron Devices.
Publication Year :
2009
Publisher :
IEEE, 2009.

Abstract

The design of four resistive memory sensing circuit topologies employing delta-sigma (DeltaSigma) modulation are presented. Operation of the designs and a comparison between simulations and experimentation is given. The designs were fabricated in a 500 nm CMOS process. Measured results indicate that the resistive values ranging from a chosen reference resistance to several hundred kOmega can be sensed reliably.

Details

Database :
OpenAIRE
Journal :
2009 IEEE Workshop on Microelectronics and Electron Devices
Accession number :
edsair.doi...........d99f6c8274b3f5d544ca22c0b0f4ef5d
Full Text :
https://doi.org/10.1109/wmed.2009.4816149