High-sensitive imaging with scanning transmission hard X-ray microscope

High-sensitive differential phase imaging has been performed with hard x-ray scanning transmission microscope optics and an imaging detector. A microbeam with the size of 60 nm at 8 keV x ray is generated by highly-coherent illuminated beam at x-ray undulalor beamline BL20XU of SPring-8. The differential phase image is reconstructed by data set consists of diffraction images of each scan position. Advantages for absorption imaging are shown with some objects.