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Electron-Bombardment Damage in Silicon
- Source :
- Physical Review. 110:1272-1279
- Publication Year :
- 1958
- Publisher :
- American Physical Society (APS), 1958.
-
Abstract
- >Neutron-bombardment damage in silicon is compared to electron- bombardment effects which have been previously analyzed. A discrete energy level 0.27 ev above the valence band previously ascribed to the acceptor member of a defect pair having a separation greater than 50 A, is found to be produced by both neutrons and electrons. A spectrum of energy levels ruaning from 0.16 ev below the conduction band toward the middle of the gap is ascribed to a defect pair with variable spacing, and related to the discrete level 0.16 ev below the conduction band which was found previously in electron-bombardment of silicon, and there ascribed to a close-spaced pair of defects. Lifetime effects are found to be dominated by levels near the middle of the energy gap, which may be related to the above spectrum. A very rapid decrease in mobility at low temperature is ascribed to bombardanent-induced imhomogeneities. (auth)
Details
- ISSN :
- 0031899X
- Volume :
- 110
- Database :
- OpenAIRE
- Journal :
- Physical Review
- Accession number :
- edsair.doi...........d81335b6ff6d851dda45b48ef59ca77d