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Fast Diagnosis of Multiple Open-Circuit Faults in a T-type Inverter Based on Voltages across Half-Bridge Switches
- Source :
- 2018 IEEE International Power Electronics and Application Conference and Exposition (PEAC).
- Publication Year :
- 2018
- Publisher :
- IEEE, 2018.
-
Abstract
- This paper proposes a fast multiple semiconductor open-circuit fault diagnosis method for a T-type three-level inverter. In this method, appropriate Boolean operations are selected to represent the relationship between voltages across the upper half-bridge switches and switching signals. Based on this, the current path in the circuit can be tracked under normal and abnormal conditions. Logical relationships are linked to corresponding switch states, so this method is applicable even under multiple open circuit faults. Diagnosis results can be obtained rapidly, with simple hardware. Misdiagnosis caused by delays in power devices and sampling circuits can be avoided if switching signal dead time is longer than the total delay. This diagnostic scheme is immune to load disturbances and dead times. Experimental results obtained under various conditions demonstrate the applicability and performance of the approach.
- Subjects :
- Computer science
Open-circuit voltage
020208 electrical & electronic engineering
05 social sciences
02 engineering and technology
Dead time
Fault (power engineering)
Control theory
Half bridge
Path (graph theory)
0202 electrical engineering, electronic engineering, information engineering
Inverter
0501 psychology and cognitive sciences
Power semiconductor device
050107 human factors
Voltage
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2018 IEEE International Power Electronics and Application Conference and Exposition (PEAC)
- Accession number :
- edsair.doi...........d7c7550ca608f1d87127bda2b7329e29