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Atomic layer etching of germanium

Authors :
Shigeru Imai
Keiji Ikeda
Masakiyo Matsumura
Source :
Applied Surface Science. 112:87-91
Publication Year :
1997
Publisher :
Elsevier BV, 1997.

Abstract

Atomic layer etching of Ge has been investigated experimentally based on the surface chemistry that Cl can adsorb on the clean Ge surface at room temperature and desorb thermally as GeCl 2 at high temperatures. The ideal etching rate of one monolayer per cycle has been achieved. The critical Cl 2 dosage for the saturated etching rate was about 7.2×10 6 L. Increase of the surface roughness after etching of 100 cycles was about 3.5 monolayers.

Details

ISSN :
01694332
Volume :
112
Database :
OpenAIRE
Journal :
Applied Surface Science
Accession number :
edsair.doi...........d748e47919ac267457bf6636761c3442