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Pixelated STEM detectors: opportunities and challenges
- Source :
- European Microscopy Congress 2016: Proceedings
- Publication Year :
- 2016
- Publisher :
- Wiley-VCH Verlag GmbH & Co. KGaA, 2016.
Details
- Database :
- OpenAIRE
- Journal :
- European Microscopy Congress 2016: Proceedings
- Accession number :
- edsair.doi...........d742369d92ae427fc8eaa988c4a3d097