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A survey of approaches in Deep Learning techniques for the detection and classification of mammography abnormalities
- Source :
- 2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE).
- Publication Year :
- 2022
- Publisher :
- IEEE, 2022.
Details
- Database :
- OpenAIRE
- Journal :
- 2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)
- Accession number :
- edsair.doi...........d503e89ec31341e66c5dc94d20db57af
- Full Text :
- https://doi.org/10.1109/cce56709.2022.9975900