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Muon capture probability of carbon and oxygen for CO, CO2, and COS under low-pressure gas conditions

Authors :
Taichi Miura
Yasuhiro Miyake
Koichiro Shimomura
Patrick Strasser
Naritoshi Kawamura
Takashi Nagatomo
Kenya M. Kubo
Atsushi Shinohara
Takashi U. Ito
Wataru Higemoto
Kazuhiko Ninomiya
Go Yoshida
Source :
Journal of Radioanalytical and Nuclear Chemistry. 303:1277-1281
Publication Year :
2014
Publisher :
Springer Science and Business Media LLC, 2014.

Abstract

When a negatively charged muon is stopped in a substance, it is captured by an atom of the substance, and the muonic atom is formed. The muon capture process is significantly affected by the chemical environment of the atom and factors such as molecular structure (chemical effect). In this study, we performed muon irradiation for low-pressure CO, CO2, and COS molecules and measured the muonic X-rays emitted immediately after muon capture by an atom. In this paper, we quantitatively discuss the muon capture probability of each type of atom using the LMM model.

Details

ISSN :
15882780 and 02365731
Volume :
303
Database :
OpenAIRE
Journal :
Journal of Radioanalytical and Nuclear Chemistry
Accession number :
edsair.doi...........d438d1e8867070d60c0166005ceea904