Back to Search Start Over

Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry

Authors :
L. M. Sorokin
R. N. Kyutt
V. V. Ratnikov
A. E. Kalmykov
Source :
Technical Physics Letters. 47:893-896
Publication Year :
2021
Publisher :
Pleiades Publishing Ltd, 2021.

Subjects

Subjects :
Physics and Astronomy (miscellaneous)

Details

ISSN :
10906533 and 10637850
Volume :
47
Database :
OpenAIRE
Journal :
Technical Physics Letters
Accession number :
edsair.doi...........d1a3e9db0e232d3fa1ca8399356a3c87

Tools

Authors Abstract Subjects Details