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Quartz Microbalance Studies of an Adsorbed Helium Film
- Source :
- Physical Review Letters. 29:211-214
- Publication Year :
- 1972
- Publisher :
- American Physical Society (APS), 1972.
-
Abstract
- The resonant frequency of a quartz crystal oscillating in the thickness-shear mode changes by virtue of the mass loading due to any type of film laid down on its surfaces. For a helium film only the normal fraction remains rigidly coupled to the substrate motion. Adsorption isotherms of He-4 measured with this technique show clear departures from conventional nonsuperfluid behavior. We attribute this effect to the onset and presence of superfluidity in the film.
- Subjects :
- Materials science
Condensed matter physics
General Physics and Astronomy
chemistry.chemical_element
Substrate (electronics)
Molecular physics
Superfluidity
Crystal
Condensed Matter::Materials Science
Adsorption
chemistry
Condensed Matter::Superconductivity
Thin film
Isotopes of helium
Quartz
Helium
Subjects
Details
- ISSN :
- 00319007
- Volume :
- 29
- Database :
- OpenAIRE
- Journal :
- Physical Review Letters
- Accession number :
- edsair.doi...........d1185d45296202539f522785336bb043
- Full Text :
- https://doi.org/10.1103/physrevlett.29.211