Preparation of silicon cross-sectional specimens for TEM observation

MLA

Martina Giannini, et al. “Preparation of Silicon Cross-Sectional Specimens for TEM Observation.” Ultramicroscopy, vol. 12, Jan. 1983, p. 106. EBSCOhost, https://doi.org/10.1016/0304-3991(83)90339-x.

APA

Martina Giannini, Aldo Armigliato, M. Vanzi, & A. Garulli. (1983). Preparation of silicon cross-sectional specimens for TEM observation. Ultramicroscopy, 12, 106. https://doi.org/10.1016/0304-3991(83)90339-x

Chicago

Martina Giannini, Aldo Armigliato, M. Vanzi, and A. Garulli. 1983. “Preparation of Silicon Cross-Sectional Specimens for TEM Observation.” Ultramicroscopy 12 (January): 106. doi:10.1016/0304-3991(83)90339-x.