Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks

Conducting scanning probe microscopy provides a powerful tool for measuring electric transport through small surface features. In this chapter, carbon nanotubes and carbon nanotube networks are analyzed with a scanning probe microscopy method that employs solid metal tips to provide improved electrical contact to the nanotubes. The study reveals paths of electrical transport through carbon nanotubes and provides a means to differentiate between semiconducting and metallic nanotubes. Finally, high-resolution images provide insight into the conductance decay around nanotube junctions.