On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns

MLA

C. Chitti Babu. “On the Application of Probabilistic Distance Measures for the Extraction of Features from Imperfectly Labeled Patterns.” International Journal of Computer & Information Sciences, vol. 2, June 1973, pp. 103–14. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........cf99929f3b6caf3a761de074f42586e2&authtype=sso&custid=ns315887.

APA

C. Chitti Babu. (1973). On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns. International Journal of Computer & Information Sciences, 2, 103–114.

Chicago

C. Chitti Babu. 1973. “On the Application of Probabilistic Distance Measures for the Extraction of Features from Imperfectly Labeled Patterns.” International Journal of Computer & Information Sciences 2 (June): 103–14. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........cf99929f3b6caf3a761de074f42586e2&authtype=sso&custid=ns315887.