Sensitivity degradation of X-ray diodes in 2 to 6 keV

Authors :: 王亮平 Wang Liangping
赵屹东 Zhao Yidong
吕敏 Lü Min
邱孟通 Qiu Mengtong
吴坚 Wu Jian
崔明启 Cui Mingqi
郑雷 Zheng Lei
吴刚 Wu Gang
邱爱慈 Qiu Aici
丛培天 Cong Peitian
Source :: High Power Laser and Particle Beams. 22:1285-1290
Publication Year :: 2010
Publisher :: Shanghai Institute of Optics and Fine Mechanics, 2010.

Subjects :: Materials science
business.industry
X-ray
Optoelectronics
Degradation (geology)
Electrical and Electronic Engineering
business
Sensitivity (electronics)
Atomic and Molecular Physics, and Optics
Diode

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