Morphological, Raman, electrical and dielectric properties of rare earth doped X-type hexagonal ferrites

The influence of rare-earth metals (La, Nd, Gd, Tb, Dy) on morphology, Raman, electrical and dielectric properties of Ba2NiCoRExFe28−xO46 ferrites were studied. The scanning electron microscopy (SEM) exhibited the platelet like structure of these hexagonal ferrites. The surface morphology indicated the formation of ferrite grains in the nano-regime scale. The bands obtained at lower wave number may be attributed to the metal-oxygen vibration at octahedral site which confirm the development of hexagonal phase of these ferrites. The resonance peaks were observed in dielectric constant, dielectric loss factor and quality factor versus frequency graphs. These dielectric parameters indicate that these ferrites nano-materials are potential candidates in the high frequency applications. The enhancement in DC electric resistivity from 2.48×108 to 1.20×109 Ω cm indicates that the prepared materials are beneficial for decreasing the eddy current losses at high frequencies and for the fabrication of multilayer chip inductor (MLCI) devices.