Compact time‐of‐flight mass spectrometer using particle‐induced desorption

This paper describes the design and operation of a time‐of‐flight mass spectrometer that uses fast, heavy ions from the spontaneous fission of Cf‐252 to desorb species from the surfaces of solids. The technique provides for a simultaneous, multimass, isotope specific, elemental, and molecular surface characterization without complications due to surface charging.