Tracking Quantum Effects at the Nanometer Scale with EELS and Cathodoluminescence

Authors :: O. Stéphan
Marcel Tence
Mathieu Kociak
Alberto Zobelli
Jean-Denis Blazit
Romain Bourrellier
Luiz Galvao-Tizei
Hugo Lourenço-Martins
Alfredo Campos
Sophie Meuret
Matthias Hillenkamp
Source :: Microscopy and Microanalysis. 25:952-953
Publication Year :: 2019
Publisher :: Oxford University Press (OUP), 2019.

Subjects :: Materials science
Scale (ratio)
business.industry
Optoelectronics
Cathodoluminescence
Nanometre
business
Tracking (particle physics)
Instrumentation

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