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Raman Investigation of Stress Relaxation at the 3C-SiC/Si Interface

Authors :
L. A. Falkovsky
Jean Camassel
Nicolas Planes
Jean-Marie Bluet
Source :
Materials Science Forum. :395-398
Publication Year :
1998
Publisher :
Trans Tech Publications, Ltd., 1998.

Details

ISSN :
16629752
Database :
OpenAIRE
Journal :
Materials Science Forum
Accession number :
edsair.doi...........cc19a7787088256251c1c1030e52a4dc
Full Text :
https://doi.org/10.4028/www.scientific.net/msf.264-268.395