Back to Search Start Over

High-resolution direct-detection x-ray imagers

Authors :
James B. Boyce
Michael M. Schieber
Jeffrey T. Rahn
Jackson Ho
Kanai S. Shah
Haim Hermon
Francesco Lemmi
Marcelo Mulato
Koenraad F. Van Schuylenbergh
Robert A. Street
Paul R. Bennett
Steve E. Ready
Jeng-Ping Lu
Raj B. Apte
Per Nylén
Ping Mei
Source :
SPIE Proceedings.
Publication Year :
2000
Publisher :
SPIE, 2000.

Abstract

We report on a-Si direct detection x-ray image sensors with polycrystalline PbI2, and more recently with HgI2. The arrays have 100 micron pixel size and, we study those aspects of the detectors that mainly determine the DQE, such as sensitivity, effective fill factor, dark current noise, noise power spectrum, and x-ray absorption. Line spread function data show that in the PbI2 arrays, most of the signal in the gap between pixels is collected, which is important for high,DQE. The leakage current noise agrees with the expected shot noise value with only a small enhancement at high bias voltages. The noise power spectrum under x-ray exposure is reported and compared to the spatial resolution information. The MTF is close to the ideal sinc function, but is reduced by the contribution of K-fluorescence in the PbI2 film for which we provide new experimental evidence. The role of noise power aliasing in the DQE and the effect of slight image spreading are discussed. Initial studies of HgI2 as the photoconductor material show very promising results with high x-ray sensitivity and low leakage current.

Details

ISSN :
0277786X
Database :
OpenAIRE
Journal :
SPIE Proceedings
Accession number :
edsair.doi...........cbf6069b36572b512de913a31fd662fb
Full Text :
https://doi.org/10.1117/12.384516