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Growth and characterization of In–Se films
- Source :
- Vacuum. 62:321-324
- Publication Year :
- 2001
- Publisher :
- Elsevier BV, 2001.
-
Abstract
- Thin films of InSe were obtained by thermal and flash evaporation techniques on glass substrates maintained at various temperatures ( T S =30, 100, 160, 200°C). The best films were obtained for a substrate temperature of 160°C followed by annealing at 200°C for 6 h. Analysis of the films showed strong decomposition of films obtained by thermal evaporation. Structural studies showed the presence of In 4 Se 3 with InSe. The chemical formula of the composite is In x Se 1− x . The values of x found by the microprobe analysis vary between 0.52 and 0.56. Optical absorption data are also explained in terms of composition variation.
Details
- ISSN :
- 0042207X
- Volume :
- 62
- Database :
- OpenAIRE
- Journal :
- Vacuum
- Accession number :
- edsair.doi...........ca8aa11a42a5617eca77de2d8422efc4
- Full Text :
- https://doi.org/10.1016/s0042-207x(01)00157-9