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400-V Amorphous IGZO Thin-Film Transistors With Drift Region Doped by Hydrogen

Authors :
Guangan Yang
Hao Tian
Zuoxu Yu
Tingrui Huang
Yong Xu
Huabin Sun
Weifeng Sun
Wangran Wu
Source :
IEEE Transactions on Electron Devices. 69:3732-3736
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
15579646 and 00189383
Volume :
69
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........c8d4d32676108ce53480f6565bef2e54
Full Text :
https://doi.org/10.1109/ted.2022.3178056