Back to Search Start Over

Microroughness measurements and EUV calibration of the solar ultraviolet imager multilayer-coated mirrors

Authors :
David L. Windt
Sherry L. Baker
Shayna Khatri
Regina Soufli
Eric M. Gullikson
Marilyn E. Bruner
Dennis S. Martinez-Galarce
Jeff C. Robinson
Evan Prast
Eberhard Spiller
Source :
SPIE Proceedings.
Publication Year :
2012
Publisher :
SPIE, 2012.

Abstract

The Solar Ultraviolet Imager (SUVI) is one of several instruments that will fly on board the next generation of Geostationary Operational Environmental Satellites (GOES) -R and -S platforms, as part of NOAA's space weather monitoring fleet. SUVI is a Generalized Cassegrain telescope that employs multilayer-coated optics that operate in six extreme ultraviolet (EUV) narrow bandpasses centered at 93.9, 131.2, 171.1, 195.1, 284.2 and 303.8 A. Once operational, over the mission lifetime expected to last up to 10 years, SUVI will record full disk, EUV spectroheliograms every few minutes, where this data will be used to better understand the effects of solar produced EUV radiation on Earth and the near-Earth environment. The material presented herein will touch upon general aspects of the SUVI optical design, as well as the fabrication, super polishing and metrology of the fabricated mirrors, including measured EUV spectral performance.

Details

ISSN :
0277786X
Database :
OpenAIRE
Journal :
SPIE Proceedings
Accession number :
edsair.doi...........c87b6c8a1afa7bdf7bb77b059219d388
Full Text :
https://doi.org/10.1117/12.953571